OPA27GP

FEATURES

q LOW NOISE: 4.5nV/Hz max 1kHz q LOW OFFSET: 100µV max q LOW DRIFT: 0.4µV/°C q HIGH OPEN-LOOP GAIN: 117dB min q HIGH COMMON-MODE REJECTION: 100dB min q HIGH POWER-SUPPLY REJECTION: 94dB min q FITS OP-05, AD510, AND AD517

APPLICATIONS

q PRECISION INSTRUMENTATION q DATA ACQUISITION q TEST EQUIPMENT q PROFESSIONAL AUDIO EQUIPMENT q TRANSDUCER AMPLIFIERS q RADIATION HARD EQUIPMENT

DESCRIPTION
The OPA27 and OPA37 are ultra-low noise, high-precision monolithic operational amplifiers.

Laser-trimmed thin-film resistors provide excellent long-term voltage offset stability and allow superior voltage offset compared to common zener-zap techniques.

A unique bias current cancellation circuit allows bias and offset current specifications to be met over the full to +85°C temperature range.

The OPA27 is internally compensated for unity-gain stability. The decompensated OPA37 requires a closed-loop gain 5.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.

Supply Voltage : ±22V Internal Power Dissipation : 500mW Input Voltage : ±VCC Output Short-Circuit Duration (3) : Indefinite Differential Input Voltage : ±0.7V Differential Input Current : ±25mA Storage Temperature Range to +125°C Operating Temperature Range to +85°C Lead Temperature:

NOTES: (1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. (2) Maximum package power dissipation versus ambient temperature. (2) To common with ±VCC 15V. (4) The inputs are protected by back-to-back diodes. Current limiting resistors are not used in order to achieve low noise. If differential input voltage exceeds ±0.7V, the input current should be limited to 25mA.

NOTE: (1) For the most current package and ordering information, see the Package Option Addendum located at the end of this document, or see the TI website at www.ti.com.

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

OFFSET VOLTAGE (2) Input Offset Voltage Average Drift (3) Long Term Stability (4)

BIAS CURRENT Input Bias Current OFFSET CURRENT Input Offset Current IMPEDANCE Common-Mode VOLTAGE RANGE Common-Mode Input Range Common-Mode Rejection OPEN-LOOP VOLTAGE GAIN, DC

Output Resistance Short Circuit Current POWER SUPPLY Rated Voltage Range, Derated Performance Current, Quiescent TEMPERATURE RANGE Specification Operating

NOTES: (1) Measured with industry-standard noise test circuit (Figures 1 and 2). Due to errors introduced by this method, these current noise specifications should be used for comparison purposes only. (2) Offset voltage specification are measured with automatic test equipment after approximately 0.5 seconds from power turnon. (3) Unnulled or nulled with to 20k potentiometer. (4) Long-term voltage offset vs time trend line does not include warm-up drift. (5) Typical specification only on plastic package units. Slew rate varies on all units due to differing test methods. Minimum specification applies to open-loop test. (6) This parameter specified by design.